ATEX Environment,Imaging,Backscattered images transmission images with use of RE Window,Illumination,Internal light source: Standard: 6 lasers
RE-Window: 8 total lasers,Field of View,1075μm x825μm,Resolution,2 to"> 立博体育官网(中国)科技有限公司

Technologia PVM® V825 Ex - produkt wycofany

Mikroskop do obserwacji cząstek w warunkach procesowych

Technologia PVM® pozwala naukowcom i inżynierom śledzić i rejestrować w czasie rzeczywistym obrazy mikroskopowe kryształów, cząstek i kropli w stanie w jakim występują w procesie - przy pełnym stężeniu procesowym.

Technologia PVM® V825 jest przeznaczona do stosowania w ramach projektów badawczo-rozwojowych i do monitorowania procesów realizowanych w dowolnej skali. Technologia pozwala szybko badać, praktycznie w każdych warunkach występujących w przemyśle, systemy zawierające cząstki i krople w celu zrozumienia ich zachowania. Podstawowe właściwości technologii PVM® V825:

  • Obrazy mikroskopowe o doskonałej rozdzielczości dostarczane przez mikroskop PVM® V819 z sondą (2 µm i większe)
  • Sonda o średnicy 25 mm posiadająca wytrzymałą konstrukcję, która może pracować w trybie ciągłym przez cały rok w warunkach przemysłowych
  • Dostępne są również sondy wysokociśnieniowe (do 150 bar)

Wycofano: Mar, 2014

Zadzwoń

Produkt zastępczy: ParticleView V19

View Inline Particle Size and Shape in Real Time With In Situ PVM images

ParticleView V19 with PVM (Particle Vision and Measurement) technology is a probe-based video microscope that visualizes particles and particle mechanisms as they exist in process.  High resolution images are continuously captured under a wide range of process conditions without the need for sampling or offline analysis. A process trend, sensitive to changes in particle size and concentration, is automatically combined with the most relevant images, providing scientists with a straightforward and reliable method to ensure comprehensive understanding is acquired with every experiment.

  • Study Particle Size and Shape - High resolution imaging of particles in real time enables scientists to determine the influence of process parameters on particle size and shape.  Particles can be designed to behave predictably as key parameters change during development, scale-up and manufacturing.
  • Characterize Transient Events and Elusive Mechanisms - Particles and particle structures often change when sampled.  By visualizing crystals, droplets and other delicate particle structures inline, scientists can characterize transient events and elusive mechanisms that may be critical for optimizing the quality of a product or process.
  • Investigate Critical Process Events and Upsets - An image-based trend, sensitive to changing particle size, shape and concentration, helps scientists identify and then investigate important process events and upsets.  The fast and reliable method reduces the time and effort needed to fully understand complex particle systems and processes.
  • Make Evidence-Based Decisions At a Lower Cost - By visualizing particles and particle mechanisms inline, scientists acquire knowledge that would otherwise prove too difficult or time consuming to obtain.  Such knowledge supports evidence-based decision making and process development at a lower cost.

Dokumentacja - Technologia PVM® V825 Ex

Akcesoria - Technologia PVM® V825 Ex

Service - Technologia PVM® V825 Ex

Keeping PVM® V825 running at peak performance is the best way to optimize the Total Cost of Ownership (TCO) as it ensures maximum Uptime and Performance as well as maintaining Compliance with quality and industry standards.

METTLER TOLEDO Field Service Engineers possess the experience and Expertise for successful asset lifecycle management.

From onsite instrument Calibration and Preventive Maintenance (PM) to Full Service Coverage, the options available can be tailored to meet need and budget requirements ensuring complete cost control.

Extended Warranty

The most cost effective option for new instrument owners as it can be purchased at point of sale.  It protects the system beyond the initial factory warranty and provides additional value-added services, priority support and discounts.

Full Service Coverage

To keep the laboratory or production process running at maximum speed, instrument Uptime, Performance and Compliance are key. It is important to identify issues before they become problems and Full Service Coverage helps ensure instruments are available when needed by providing priority onsite and factory service with no cost surprises.

Calibration and Preventive Maintenance

The best option if budgetary constraints and Total Cost of Ownership are not a primary concern and instrument downtime does not affect productivity. Repair costs are on an ad-hoc basis but Calibration and Preventive Maintenance ensures equipment Performance and Compliance are within specification.

METTLER TOLEDO Service Specialists


The METTLER TOLEDO Service Team understands what it takes to get the best from each instrument. Benefit from the Service Team’s experience and industry knowledge to ensure optimal equipment Uptime, Performance, Compliance and the Expertise necessary to maximize instrument investment.

Take advantage of the experience, skills and thorough know-how of the dedicated Field Service Engineers strategically located around the world and locally - which ensures a timely response.

Dane techniczne- Technologia PVM® V825 Ex

Dane techniczne - Technologia PVM® V825 Ex
For Use In Pilot Plant or Production<br>ATEX Environment
Imaging Backscattered images, transmission images with use of RE Window
Illumination Internal light source: Standard: 6 lasers<br>RE-Window: 8 total lasers
Field of View 1075μm x825μm
Resolution 2 to 1000μm
Probe Diameter 25mm
Probe Wetted Length 303mm
Probe Wetted Alloy C22
Window Sapphire
Standard Window Seals Kalrez®
Probe/Window Options RE Window (RE Window capability available as replaceable window - can be ordered separately as necessary)
Pressure Rating (Probe) 10barg (standard)<br>up to 150barg (custom)
Temperature Rating (Probe) -10 to 120°C
Conduit Length 10m [32.8ft]
Enclosure Description Stainless field enclosure with over-pressure protection (Nema 4X&semi; IP66&semi; rated for ATEX Zone 1,21)
Temperature Range (Base/Field Unit) -20 to 40°C
Base/Field Unit Dimensions (NOT shipping dimensions) Height: 522mm [20.6in]<br>Width: 486mm [19.1in]<br>Depth: 251mm [9.9in]
Certifications CE Approved, Class 1 Laser<br>ATEX: Field Unit - Zone 1, 21<br>Probe - Zone 0, 20
Air Requirements Purge Requirements for ATEX Rating<br>Pressure: 4-8barg [60-120psig]<br>Flow: 50 NL/min [1.8SCFM]
Power Requirements 230 VAC, 50-60Hz, 0.2A, 21W